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Automatically generating test data from a Boolean specification

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3 Author(s)
Weyuker, E. ; AT&T Bell Labs., Murray Hill, NJ, USA ; Goradia, T. ; Singh, A.

This paper presents a family of strategies for automatically generating test data for any implementation intended to satisfy a given specification that is a Boolean formula. The fault detection effectiveness of these strategies is investigated both analytically and empirically, and the costs, assessed in terms of test set size, are compared

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Software Engineering, IEEE Transactions on  (Volume:20 ,  Issue: 5 )