By Topic

Automatically generating test data from a Boolean specification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Weyuker, E. ; AT&T Bell Labs., Murray Hill, NJ, USA ; Goradia, T. ; Singh, A.

This paper presents a family of strategies for automatically generating test data for any implementation intended to satisfy a given specification that is a Boolean formula. The fault detection effectiveness of these strategies is investigated both analytically and empirically, and the costs, assessed in terms of test set size, are compared

Published in:

Software Engineering, IEEE Transactions on  (Volume:20 ,  Issue: 5 )