Cart (Loading....) | Create Account
Close category search window
 

Measurement of carrier escape rates, exciton saturation intensity, and saturation density in electrically biased multiple-quantum-well modulators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Sizer, T. ; AT&T Bell Labs., Holmdel, NJ, USA ; Woodward, T.K. ; Keller, U. ; Sauer, K.
more authors

In this paper, we detail the results of exciton saturation intensity measurements on strained InAsP/InP and InGaAs/GaAs multiple quantum well modulators designed for 1 μm operation and under electrical bias as is required for device operation. Carrier escape times from the quantum well were also measured for both electrons and holes. These measurements allow the first experimental determination of the saturation density of the material under electrical bias. This density can also be calculated using a theoretical model proposed by Schmitt-Rink, et al. The experimentally measured density is in good agreement with this theoretical model

Published in:

Quantum Electronics, IEEE Journal of  (Volume:30 ,  Issue: 2 )

Date of Publication:

Feb 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.