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Integration of physical reliability knowledge into the design of VLSI-circuits

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4 Author(s)
van Geest, D.C.L. ; Fac. of Electr. Eng., Twente Univ., Enschede, Netherlands ; Hoeksma, R.H. ; Brombacher, A.C. ; Hermann, O.E.

A systematic approach for modeling failure mechanisms on the circuit level and for using these models for optimization of both reliability and functionability is presented. Since optimization is done using a CAD system, it is possible to carry out such an optimization in a very early stage of the design process. The stress factors of the failure mechanisms are calculated using a circuit simulator and the effect of internal and external tolerances is incorporated in the simulation. From these results the sensitivity of failure behavior for so-called designable parameters on circuit level is determined. This information is used to optimize the design toward minimum occurrence of failures. For functional demands the same methodology is used.<>

Published in:

Reliability Physics Symposium, 1993. 31st Annual Proceedings., International

Date of Conference:

23-25 March 1993

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