By Topic

On probabilistic testing of large-scale sequential circuits using circuit decomposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Das, S.R. ; Dept. of Electr. Eng., Ottawa Univ., Ont., Canada ; Wen-Ben Jone ; Nayak, A.R. ; Choi, I.

In this paper the detection of permanent faults in sequential circuits by random testing is analyzed utilizing the circuit partitioning approach together with a continuous parameter Markov model. Given a large sequential circuit, it is partitioned into several smaller partitions using either series or parallel decomposition. For each partition with certain stuck faults specified, the original state table and its error version are derived from an analysis of the partition under fault-free and faulty conditions, respectively. A random testing strategy that uses a three-state Markov model is used for detecting permanent stuck faults. Experimentation on various sequential circuits has shown that a significant saving in testing or test generation time can be achieved if we can partition the circuit and then test each of its components as opposed to testing the circuit in its original form

Published in:

VLSI Design, 1994., Proceedings of the Seventh International Conference on

Date of Conference:

5-8 Jan 1994