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Simulated annealing for target-oriented partial scan

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2 Author(s)
Ravikumar, C.P. ; Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India ; Rasheed, H.

In this paper, we describe algorithms based on simulated annealing for selecting a subset of flip-flops to be connected into a scan path. The objective for selection is to maximise the coverage of faults that are aborted by a sequential fault simulator. We pose the problem as a combinatorial optimization, and present a heuristic algorithm based on simulated annealing. The SCOAP testability measure is employed to assess the selection of flip-flops during the course of optimization. Our algorithms form a part of an integrated design package, TOPS, which has been designed as an enhancement to the OASIS standard-cell design automation system available from MCNC. We discuss the TOPS package and its performance on a number of ISCAS'89 benchmarks. We also present a comparative evaluation of the benchmark results

Published in:

VLSI Design, 1994., Proceedings of the Seventh International Conference on

Date of Conference:

5-8 Jan 1994