Cart (Loading....) | Create Account
Close category search window
 

Bit error probability calculations for convolutional codes with short constraint lengths on very noisy channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Herro, M.A. ; Dept. of Electr. & Comput. Eng., Notre Dame Univ., IN, USA ; Hu, L. ; Nowack, J.M.

A technique for estimating convolutional code performance on very noisy channels is considered. Specifically, the performance of short constraint length codes operating near the channel cutoff rate is estimated. Decoding convolutional codes with a sliding window decoder (SWD) are considered. This decoder is an optimal (maximum likelihood) symbol decoder as the window size grows toward infinity, while the Viterbi decoder is the maximum-likelihood sequence estimator. The difference in the decoded BERs (bit error rates) between the two decoders is very small and approaches zero asymptotically as the channel BER decreases. Therefore, an estimate on the decoded BER for the SWD can also be used as an estimate of the decoded BER for Viterbi decoding

Published in:

Communications, IEEE Transactions on  (Volume:36 ,  Issue: 7 )

Date of Publication:

Jul 1988

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.