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A new approach to point pattern matching

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2 Author(s)
Jiawei Hong ; Courant Inst., New York Univ., NY, USA ; Xiaonan Tan

An approach to planar point pattern matching is presented in which the point sets are first transformed to the canonical forms, under affine transformation, and then two canonical forms are compared directly. A method for transforming a set of n points to a canonical form in O(n) time and an average O(n) time algorithm for finding a matching between canonical forms of two point sets are proposed

Published in:

Pattern Recognition, 1988., 9th International Conference on

Date of Conference:

14-17 Nov 1988