By Topic

Microstructural investigations of fine grain Co-Hf-C films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Suwabe, S. ; Dept. of Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Wong, Bunsen Y. ; Laughlin, D.E.

Microstructural investigations have been performed on Co-Hf-C films which show high μ (>2000), high Bs (1.4 T), and high thermal stability (>700°C). The magnetic properties are very sensitive to the volume fraction of HfC particles. After annealing at 700°C, Co-Hf-C films of the optimum composition consist of a mixture of fine FCC-Co and HfC grains. The grain size of FCC-Co is 10~15 nm and that of HfC is 3~4 nm. The HfC particles are located at the grain boundaries of FCC-Co. HfC was found to crystallize before the FCC-Co, and the fine dispersion of these particles successfully inhibited the grain growth of the FCC-Co

Published in:

Magnetics, IEEE Transactions on  (Volume:29 ,  Issue: 6 )