By Topic

Observation of thin film magnetostriction using a piezoelectric sensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shin, Y.-D. ; Dept. of Phys., Jeonbuk Nat. Univ., Jeonju, South Korea ; Yong-Ho Lee ; Rhee, Jang-Roh

A cantilevered glass substrate with a magnetic thin film deposited on one side vibrates under an alternating magnetic field applied parallel to the film surface. The vibration amplitude, which is proportional to magnetostriction constant of the film, is measured with a bimorph piezoelectric sensor. The magnetostriction of such a film can be calculated from the vibration amplitude, elastic modulus and geometry of the sample. The generated electrostatic charge is proportional to the amplitude in the sensor and measured using an analog integrator, which is also an effective noise suppressor. The instrument is calibrated with a Ni film as the standard

Published in:

Magnetics, IEEE Transactions on  (Volume:29 ,  Issue: 6 )