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Dynamic Idd test circuit for mixed signal ICs

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3 Author(s)
Arguelles, J. ; Dept. de Electron., Cantabria Univ., Santander ; Martinez, M. ; Bracho, S.

Built-in test circuitry is proposed that uses the dynamic supply current consumption of a mixed signal circuit under test for a unified fault detection method. Simulation waveform are reported to illustrate the performance of the proposed circuitry

Published in:

Electronics Letters  (Volume:30 ,  Issue: 6 )

Date of Publication:

17 Mar 1994

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