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Design and application of parallel digital signal processor based image processing system for industrial inspection

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4 Author(s)
S. P. Kshirsagar ; Sch. of Electr. & Electron. Eng., Liverpool John Moores Univ., UK ; D. A. Hartley ; D. M. Harvey ; C. A. Hobson

The use of computer-based inspection systems in industrial environments is becoming more common due to the fact that they produce consistent results compared to traditional methods of inspection. In certain manufacturing applications, the inspection of the product may become a bottleneck. This is caused by the large amount of data that has to be processed in conjunction with high computational requirements. In order to deliver the desired throughput rates required typically necessitates the use of specialised hardware. The Coherent and Electro-optics Research Group at LJMU currently has several inspection applications which require computational rates considerably higher than can be achieved using commodity systems. A parallel digital signal processor (DSP) based image processing system is being developed which will resolve the current computational deficiency

Published in:

High Performance Applications of Parallel Architectures, IEE Colloquium on

Date of Conference:

1 Feb 1994