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Measurement techniques for monolithic microwave integrated circuits

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4 Author(s)
S. Lucyszyn ; Dept. of Electron. & Electr. Eng., King's Coll., London, UK ; C. Stewart ; I. D. Robertson ; A. H. Aghvami

Introduces the basic technologies that are associated with measurements of monolithic microwave integrated circuits. The use of test fixtures and wafer probe stations at ambient room temperature is reviewed and their role at thermal and cryogenic temperatures is discussed. With the increasing need for performing non-invasive measurements, advances in experimental field probing techniques are explored

Published in:

Electronics & Communication Engineering Journal  (Volume:6 ,  Issue: 2 )