Cart (Loading....) | Create Account
Close category search window

Observation of the switching fields of individual Permalloy particles in nanolithographic arrays via magnetic force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Gibson, G.A. ; California Univ., San Diego, CA, USA ; Smyth, J.F. ; Schultz, S. ; Kern, D.P.

A technique has been developed for measuring the switching fields of individual submicron magnetic particles using a magnetic force microscope (MFM) in which an in situ magnetic field can be applied. This allows the study of the evolution of the particles' magnetic states as a function of applied field and the direct observation of cooperative switching. Observations of the switching fields for individual nanolithography Permalloy particles are compared with remanent magnetization data, taken with an alternating gradient magnetometer on both isolated and interactive arrays of these particles. Comparison of MFM images of the particles with numerical simulations has provided insight into the magnetic behavior of the sensing tips

Published in:

Magnetics, IEEE Transactions on  (Volume:27 ,  Issue: 6 )

Date of Publication:

Nov 1991

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.