Cart (Loading....) | Create Account
Close category search window

Uniform parity group distribution in disk arrays with multiple failures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ng, Spencer W. ; IBM Almaden Res. Center, San Jose, CA, USA ; Mattson, R.

Several new disk arrays have recently been proposed in which the parity groupings are uniformly distributed throughout the array so that the extra workload created by a disk failure can be evenly shared by all the surviving disks, resulting in the best possible degraded mode performance. Many arrays now also put in multiple spare disks so that expensive service calls can be deferred. Furthermore, in a new sparing scheme called distributed sparing, the spare spaces are actually distributed throughout the array. This means after a rebuild the new array will be logically different from the original array. The authors present an algorithm for constructing and maintaining arrays with distributed sparing so that repeated uniform parity group distribution is achieved with each successive failure

Published in:

Computers, IEEE Transactions on  (Volume:43 ,  Issue: 4 )

Date of Publication:

Apr 1994

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.