Cart (Loading....) | Create Account
Close category search window

Reducing correlation to improve coverage of delay faults in scan-path design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Weiwei Mao ; Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO ; Ciletti, M.D.

Simulation data are presented for eleven benchmark circuits to show how test pattern correlation in a scan-path design circuit adversely affects delay fault coverage, and to demonstrate that most undetected delay faults caused by correlation of test patterns are close to the outputs of latches. Topology-based latch correlation measures are introduced and used by a companion latch arrangement algorithm to guide the placement of latches in a scan-path design, with the objective of minimizing the effect of correlation and maximizing the coverage of delay faults. Simulation results with benchmark circuits indicate that the scan-path found by the algorithm clearly achieves better delay fault coverage than a scan-path having no deliberate arrangement. The data also indicates that the algorithm is most effective in covering delay faults that are located nearest the latch outputs of the circuit. The approach has an advantage over other arrangement schemes in that it is simple to implement and does not require significant computational time even for large circuits

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:13 ,  Issue: 5 )

Date of Publication:

May 1994

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.