Referenced Items are not available for this document.
In this paper we describe a new technique for ID and 2D edge feature extraction to subpixel accuracy using edge models and the local energy approach. A candidate edge is modeled as one of a number of parametric edge models, and the fit is refined by a least-squared error fitting technique
Published in:
Pattern Analysis and Machine Intelligence, IEEE Transactions on
(Volume:16
,
Issue:
4
)
Date of Publication: Apr 1994
- Page(s):
- 405 - 410
- ISSN :
- 0162-8828
- INSPEC Accession Number:
- 4679826
- Digital Object Identifier :
- 10.1109/34.277593
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Apr 1994
- Sponsored by :
- IEEE Computer Society
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