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Single event upset error propagation between interconnected VLSI logic devices

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1 Author(s)
Newberry, D.M. ; Control Data Corp., Minneapolis, MN, USA

The author presents experimental and analytical results of single event upset error propagation between interconnected VLSI logic devices representative of a spaceborne system. The results show that up to 50% of the time a single transistor upset internal to a logic device can result in system failure. The experimental testing has verified error propagation between interconnected VLSI devices. The data show that by neglecting the propagated errors an overly low combined error rate may be calculated at the system level. Catastrophic system-level failures were observed with occurrence frequencies between 0.2 failures/million ion/cm2 and 1.2 failures/million ions/cm2, verifying upset propagation to system output with implications of error multiplication either within individual devices or as an error propagates through the system

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Nuclear Science, IEEE Transactions on  (Volume:39 ,  Issue: 3 )