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The minimal test set for multioutput threshold circuits implemented as sorting networks

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1 Author(s)
Piestrak, S.J. ; Inst. of Eng. Cybern., Tech. Univ. of Wroclaw, Poland

It is shown that an n-input sorting network (SN) can be used to implement an n-variable symmetric threshold functions using the least amount of hardware. An algorithm to derive Boolean functions implemented on any line of any n-input threshold circuit Tn implemented as a SN is given. A heuristic procedure for generating the minimal test set for any threshold circuit Tn implemented as a Batcher's SN or any other SN is presented. The number of tests required to detect all stuck-at faults in an n-input SN is determined. A highly regular structure using only one type of simple cell and a suitability for low-level pipelining are other advantages of the circuit Tn. The circuit Tn can be used as a basic building block of various circuitry supporting the use of all known unidirectional error detecting codes

Published in:

Computers, IEEE Transactions on  (Volume:42 ,  Issue: 6 )