By Topic

Accumulator-based compaction of test responses

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rajski, J. ; Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada ; Tyszer, J.

An accumulator-based compaction (ABC) scheme for parallel compaction of test responses is introduced. The asymptotic and transient coverage drop introduced by accumulators with binary and 1's complement adders is studied using Markov chain models. It is proven that the asymptotic coverage drop in ABC with binary adders is 2-k, where k is the number of bits in the adder that the fault can reach. In ABC with 1's complement adders, the asymptotic coverage drop for a fairly general class of faults is (2n-1)-1, where n is the total number of bits. The analysis of transient behavior relates the coverage drop with the probability of fault injection, the size of the accumulator, and the length of the test experiment. The process is characterized by damping factors derived for various values of these parameters

Published in:

Computers, IEEE Transactions on  (Volume:42 ,  Issue: 6 )