Cart (Loading....) | Create Account
Close category search window
 

One-step extension approach to optimal Hankel-norm approximation and H-optimization problems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ciann-Dong Yang ; Inst. of Aeronaut. & Astronaut., Nat. Cheng Kung Univ., Tainan, Taiwan ; Fang-Bo Yeh

A methodology is presented for Hankel approximation and H -optimization problems that is based on a new formulation of a one-step extension problem which is solved by the Sarason interpolation theorem. The parameterization of all optimal Hankel approximants for multivariable systems is given in terms of the eigenvalue decomposition of an Hermitian matrix composed directly from the coefficients of a given transfer function matrix φ. Rather than starting with the state-space realization of φ, the authors use polynomial coefficients of φ as input data. In terms of these data, a natural basis is given for the finite dimensional Sarason model space and all computations involve only manipulations with finite matrices

Published in:

Automatic Control, IEEE Transactions on  (Volume:38 ,  Issue: 5 )

Date of Publication:

May 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.