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Calibration of external electron-optic sampling using field simulation and system transfer function analysis

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4 Author(s)
Wu, X. ; Commun. Res. Lab., McMaster Univ., Hamilton, Ont., Canada ; Conn, D. ; Song, J. ; Nickerson, K.

A field-based calibration technique for external electro-optic (EO) sampling has been proposed using the system transfer function approach and verified by simulation. The optical simulation incorporating finite-difference-time-domain (FDTD) full wave field analysis is used to predict the optical output in external EO sampling. It is found that distortions can be introduced by probes due to their intrinsic frequency response, which is determined by probe dimensions and materials. It is confirmed that thin probes produce less distortion in picosecond or subpicosecond measurements.<>

Published in:

Microwave Symposium Digest, 1993., IEEE MTT-S International

Date of Conference:

14-18 June 1993