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Concurrent test scheduling in built-in self-test environment

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2 Author(s)
Chen, C.-I.H. ; Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA ; Yuen, J.T.

Concurrent testing is used to reduce overall self-testing time and further exploit the power of the built-in self-test (BIST) technique. A unifying procedure, called the implicit tree search algorithm (ITSA), is used to fully exploit the test parallelism so that both the total testing time and test resources are optimized. The operation of the ITSA is demonstrated by detailed examples

Published in:

Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on

Date of Conference:

11-14 Oct 1992