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Exact maximum likelihood estimation using masked system data

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3 Author(s)
Lin, D.K.J. ; Dept. of Stat., Tennessee Univ., Knoxville, TN, USA ; Usher, J.S. ; Guess, F.M.

This work estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. The authors extend the results of Usher and Hodgson (1988) by deriving exact maximum likelihood estimators (MLE) for the general case of a series system of three exponential components with independent masking. Their previous work shows that closed-form MLE are intractable, and they propose an iterative method for the solution of a system of three nonlinear likelihood equations

Published in:

Reliability, IEEE Transactions on  (Volume:42 ,  Issue: 4 )

Date of Publication:

Dec 1993

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