Cart (Loading....) | Create Account
Close category search window

Efficient β/γ Monte Carlo transport in repetitive structures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Halbleib, J.A. ; Sandia Nat. Lab., Albuquerque, NM, USA ; Scrivner, G.J.

Algorithms are developed that permit the use of periodic and albedo boundary conditions in the ITS (Integrated TIGER Series) system of coupled electron/photon Monte Carlo transport codes when simulating transport in repetitive structures in satellite systems. Mutual verification is provided through the application of both algorithms to a simplified periodic geometry based on an array of microelectronics cards. The albedo algorithm is then used to benchmark the predictions of energy deposition in silicon by a mass sectoring code for this same application and to predict the shielding effectiveness of a hexagonal honeycomb structure. The use of these algorithms results in a major reduction in the required problem input and significant variance reduction that could otherwise be achieved only via postprocessing, which is much more problem dependent

Published in:

Nuclear Science, IEEE Transactions on  (Volume:40 ,  Issue: 6 )

Date of Publication:

Dec 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.