Cart (Loading....) | Create Account
Close category search window
 

Displacement damage effects in mixed particle environments for shielded spacecraft CCDs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Dale, C. ; US Naval Res. Lab., Washington, DC, USA ; Marshall, P. ; Cummings, B. ; Shamey, L.
more authors

Analysis of monoenergetic proton test data reveals displacement damage degradation of charge transfer efficiency in state-of-the-art charge coupled devices (CCDs). New measurements, in combination with literature data, demonstrate good agreement between the energy dependencies of proton damage and the nonionizing energy loss (NIEL) for protons in Si. Massive shields being considered to preserve CCD performance in satellites are analyzed using the transport code BRYNTRN, which quantifies both primary and secondary particle production. Using NIEL to combine the cumulative effects of both protons and neutrons reaching the CCD. Al and Ta shield approaches are compared for both trapped and flare proton environments. In general, massive Ta shields have diminished benefit owing to damage from large secondary neutron fluxes. Analysis with Shockley-Read-Hall theory demonstrates the importance of CCD operating conditions and transfer efficiency measurement techniques in evaluating flight performance and comparing results between devices and laboratories

Published in:

Nuclear Science, IEEE Transactions on  (Volume:40 ,  Issue: 6 )

Date of Publication:

Dec 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.