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Development of a new X-ray radiography system with 16 amorphous silicon linear sensors

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7 Author(s)
H. Takahashi ; Dept. of Nucl. Eng., Tokyo Univ., Japan ; K. Harada ; M. Nakazawa ; Ken-ichi Hasegawa
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An X-ray radiography system that uses multiple amorphous silicon linear sensors combined with a Gd2O2S phosphor sheet has been developed. Sixteen line sensors are aligned parallel with a spacing of 19 mm and are scanned 20 mm to cover an X-ray image. The scanning step is 0.5 mm and the accumulation time can be selected from 33 ms to 200 ms per one step. A total active area of 25.6 cm×30.0 cm with 512×608 pixels was realized. The practical problem with this system is the sensitivity variations among sensors. This problem was overcome by adopting a multilevel intensity calibration method with spatially uniform X-ray irradiation. The applicability of this system to X-ray radiography has been demonstrated through some medical applications

Published in:

IEEE Transactions on Nuclear Science  (Volume:40 ,  Issue: 6 )