Cart (Loading....) | Create Account
Close category search window

High frequency magnetic properties of CoFe/SiO2 multilayer film with the inverse magnetostrictive effect

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Senda, Masakatsu ; Visual Commun. Sector, NTT Corp., Tokyo, Japan ; Ishii, Osamu

The high frequency magnetic properties of CoFe/SiO2 multilayer film, which has magnetic anisotropy induced by the inverse magnetostrictive effect, are examined with a view to applying it as a low loss soft magnetic material in the MHz-GHz range. The inverse magnetostrictive effect was used to produce a large uniaxial anisotropy field of 200-250 Oe. A CoFe magnetic layer, with a large saturation magnetization of 24.5 kG and a magnetostriction of +10-4, was selected, and patterned in strips to produce an anisotropic film stress of -109 dyn/cm2. A relative permeability of 40 and a cut-off frequency of about 7 GHz were achieved in CoFe/SiO2 (50/100 nm) film, and these values agree well with values obtained by calculation and from static magnetic properties

Published in:

Magnetics, IEEE Transactions on  (Volume:30 ,  Issue: 1 )

Date of Publication:

Jan 1994

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.