Cart (Loading....) | Create Account
Close category search window
 

Almost sure diagnosis of almost every good element [logic testing]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
La Forge, L.E. ; Dept. of Electr. Eng., Nevada Univ., Reno, NV, USA ; Kaiyuan Huang ; Agarwal, V.K.

We demonstrate a structure for mutual test among N processing elements. We indicate how this structure might be used to identify the good dice on a semiconductor wafer at a cost below that of current techniques. Under either a digraph or a comparison model, our proposed test structure has the following properties: 1) It is nearly regular. 2) It can be laid out in area O(⊖(n). 3) In time ⊖(N) and with high probability, all but at most an arbitrarily small fraction of the good elements can be identified. 4) The number of tests or comparisons per element is bounded by a constant. We approximate this constant analytically. The result is a substantial savings over the ⊖(log N) tests per element in regular structures whose purpose is to identify, with high probability, every good element. In contrast with the majority of previous work, our results apply even when less than half of the elements are good

Published in:

Computers, IEEE Transactions on  (Volume:43 ,  Issue: 3 )

Date of Publication:

Mar 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.