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Noninvasive voltage measurement through an on-chip test structure [IC testing]

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3 Author(s)
Dai, H. ; Dept. of Electr. Eng., Lafayette Coll., Easton, PA, USA ; Choo, M. ; Starzyk, J.A.

A method to evaluate internal voltages through a built-in test structure is presented. Multiplexers are used to increase accessibility. The test structure does not affect normal operation of the circuit. Individual subcircuits can be tested selectively based on evaluated internal voltages

Published in:

Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on

Date of Conference:

9-12 Aug 1992