By Topic

RE built-in test and enabling technologies for integrated diagnostics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Chu, A. ; MITRE Corp., Bedford, MA, USA ; Cronson, H.M. ; Devine, J.F. ; Soares, S.
more authors

The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment.<>

Published in:

AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record

Date of Conference:

21-24 Sept. 1992