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Testing analogue circuits by power supply voltage control

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2 Author(s)
A'Ain, A.K.B. ; Dept. of Eng., Lancaster Univ. ; Dorey, A.P.

By varying the power supply voltages of an analogue integrated circuit as a testing technique it is possible to expose faults within the circuits which are difficult to detect by conventional input voltage stimulation. This technique is simple to implement and does not incur any area overhead penalty

Published in:

Electronics Letters  (Volume:30 ,  Issue: 3 )