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Test selection based on communicating nondeterministic finite-state machines using a generalized Wp-method

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3 Author(s)
Luo, G. ; Dept. d''Inf. et de Recherche Oper., Montreal Univ., Que., Canada ; Bochmann, G.V. ; Petrenko, A.

Presents a method of generating test sequences for concurrent programs and communication protocols that are modeled as communicating nondeterministic finite-state machines (CNFSMs). A conformance relation, called trace-equivalence, is defined within this model, serving as a guide to test generation. A test generation method for a single nondeterministic finite-state machine (NFSM) is developed, which is an improved and generalized version of the Wp-method that generates test sequences only for deterministic finite-state machines. It is applicable to both nondeterministic and deterministic finite-state machines. When applied to deterministic finite-state machines, it yields usually smaller test suites with full fault coverage than the existing methods that also provide full fault coverage, provided that the number of states in implementation NFSMs are bounded by a known integer. For a system of CNFSMs, the test sequences are generated in the following manner: a system of CNFSMs is first reduced into a single NFSM by reachability analysis; then the test sequences are generated from the resulting NFSM using the generalized Wp-method

Published in:

Software Engineering, IEEE Transactions on  (Volume:20 ,  Issue: 2 )

Date of Publication:

Feb 1994

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