Cart (Loading....) | Create Account
Close category search window

Use of the Dempster-Shafer algorithm for the detection of SAR ship wakes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rey, M. ; Defence Res. Establ., Ottawa, Ont., Canada ; Tunaley, J.K.E. ; Sibbald, T.

An automatic detection algorithm (ADA) for synthetic aperture radar (SAR) ship wakes, based upon the Dempster-Shafer algorithm, is described and applied to a large set of SEASAT wake imagery. The SEASAT images were chosen specifically to test the limitations of the ADA. Images exhibiting multiple SAR ship wakes, short or faint wake features, striated ocean backgrounds, or the presence of other naturally occurring linear ocean features, constituted the majority of images. The ADA correctly classified the majority of the images, with misclassifications linked largely to very short or faint linear features. The ADA performed very well in striated ocean regions and in areas where the wake features were competing with naturally occurring linear ocean structure

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:31 ,  Issue: 5 )

Date of Publication:

Sep 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.