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Toward a practical methodology for the statistical design of complex integrated circuit products

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1 Author(s)
Duvall, S.G. ; Intel Corp., Santa Clara, CA, USA

The author discusses statistical, as opposed to worst case, approaches to the design of complex integrated circuit products. Recent approaches and why they have failed to be widely adopted are reviewed. The author concludes with a discussion of a practical approach to complex integrated circuit design combining worst case and statistical methods.

Published in:

VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on

Date of Conference:

1993

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