Referenced Items are not available for this document.
In this paper, the authors present a new class of fault models called duplex pattern sensitive faults that represents more accurately the actual faults that can occur in dual-port DRAMs. Then, they propose an efficient linear test algorithm that allows 100% fault coverage for the considered fault model
Published in:
Memory Testing, 1993., Records of the 1993 IEEE International Workshop on
Date of Conference: 9-10 Aug 1993
- Page(s):
- 68 - 71
- Meeting Date :
- 09 Aug 1993-10 Aug 1993
- Print ISBN:
- 0-8186-4150-9
- INSPEC Accession Number:
- 4565558
- Conference Location :
- San Jose, CA
- Digital Object Identifier :
- 10.1109/MT.1993.263147
- Product Type:
- Conference Publications
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