Cart (Loading....) | Create Account
Close category search window
 

ScanBist: a multifrequency scan-based BIST method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nadeau-Dostie, B. ; Bell-Northern Res., Ottawa, Ont., Canada ; Burek, D. ; Hassan, A.S.M.

The authors present ScanBist, a low-overhead, scan-based built-in self-test method, along with its performance in several designs. A novel clock synchronization scheme allows at-speed testing of circuits. This design allows the testing of circuits operating at more than one frequency while retaining the combinational character of the circuit to be analyzed. We can therefore apply scan patterns that will exercise the circuit under test at the system speed, potentially providing a better coverage of delay faults when compared to other self-test methods. Modifications to an existing transition fault simulator account for cases where inputs originating from scan registers clocked at different frequencies drive a gate. We claim to detect transition faults only if the transition originates from the inputs driven by the highest frequency clock. ScanBist is useful at all levels of system packaging assuming that a standard TAP provides the control and boundary scan isolates the circuit from primary inputs and outputs during BIST mode.<>

Published in:

Design & Test of Computers, IEEE  (Volume:11 ,  Issue: 1 )

Date of Publication:

Spring 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.