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Diagnosis by signature analysis of test responses

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3 Author(s)
Karpovsky, M.G. ; Dept. of Electr. Comput. & Syst. Eng., Boston Univ., MA, USA ; Levitin, L.B. ; Vainstein, F.S.

Proposes a new approach for identification of faulty processing elements based on an analysis of the compressed test response of the system. The test response is compressed first in space and then in time, and faulty processing elements are identified by hard decision decoding of the corresponding space-time signature. The approach results in considerable savings in hardware required for diagnostics

Published in:

Computers, IEEE Transactions on  (Volume:43 ,  Issue: 2 )

Date of Publication:

Feb 1994

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