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Self-calibration techniques for a second-order multibit sigma-delta modulator

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4 Author(s)
Fattaruso, J.W. ; Integrated Syst. Lab., Texas Instrum. Inc., Dallas, TX, USA ; Kiriaki, S. ; De Wit, M. ; Warwar, G.

Design techniques for self-calibration of the digital-to-analog converter DAC in a multibit sigma-delta modulator are described. When used in conjunction with dynamic element matching, self-calibration provides linearity performance suitable for digital audio applications. The dynamic element matching circuitry provides the mechanism of determining device mismatch for self-calibration. Practical circuit details and an effective calibration method are discussed. Test results from a l-μm CMOS test chip are presented. In this test system, a second-order loop with a 3-b quantizer achieves an 89-dB dynamic range and -91-dB harmonic distortion after calibration. In addition, a new method of detecting the presence of tones is described, using the entropy of the spectrum of the decimation filter output

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Solid-State Circuits, IEEE Journal of  (Volume:28 ,  Issue: 12 )