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Recursive pseudoexhaustive test pattern generation

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2 Author(s)
Rajski, J. ; Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada ; Tyszer, J.

A recursive technique for generating exhaustive patterns is presented. The method is optimal, i.e., in one experiment it covers exhaustively every block of k adjacent inputs in the first 2k vectors. Implementation methods based on characteristic functions of test vectors are provided. They include a parallel pattern generator employing an exclusive-or array, and two serial generators that can be easily adopted in a scan-based built-in self-test environment

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Computers, IEEE Transactions on  (Volume:42 ,  Issue: 12 )