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SPADES-ACE: a simulator for path delay faults in sequential circuits with extensions to arbitrary clocking schemes

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2 Author(s)
Pomeranz, I. ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Reddy, S.M.

Testing of synchronous sequential circuits for path delay faults requires two sequences: a test sequence, that specifies the input values, and a clocking scheme, that specifies at what time units a fast clock should be applied. In this work, a fault simulator for path delay faults in synchronous sequential circuits is described, that has the following novel features. (1) For a given test sequence, all clocking schemes that have a single fast clock are simulated in parallel. (2) During the simulation process, it is possible to determine a minimal set of clocking schemes to achieve the same fault coverage as in (1). (3) Alternatively, it is possible to simulate the test sequence under a given clocking scheme, containing multiple fast clocks at arbitrary time units. (4) A path representation scheme is used, that allows efficient access to path delay faults detected by previous tests. Experimental results are presented to demonstrate these features and their effectiveness

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:13 ,  Issue: 2 )