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Using heavy-ion radiation to validate fault-handling mechanisms

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5 Author(s)
Karlsson, J. ; Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden ; Liden, P. ; Dahlgren, P. ; Johansson, R.
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Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.<>

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Micro, IEEE  (Volume:14 ,  Issue: 1 )