Referenced Items are not available for this document.
This work is concerned with computing the reliability of redundant systems of three-state (e.g., good, failed-open or failed-short) devices. Allowing for multiple failures, formulas are presented for calculating the reliability of a parallel-series system or a series-parallel system which is formed from three-state, non-DFM (dual failure-mode) devices, and which might require multiple paths to function. The words series and parallel are used in the layout-diagram sense. The formulation encompasses cases which have been analyzed by complex methods in numerous papers on the reliability of three-state DFM device systems. The effects of dominant failure-modes on the relationship between reliability of a series system and that of a parallel system, and on the relationship between the reliability of a parallel-series system and that of series-parallel system are presented
Published in:
Reliability, IEEE Transactions on
(Volume:42
,
Issue:
3
)
Date of Publication: Sep 1993
- Page(s):
- 470 - 477
- ISSN :
- 0018-9529
- INSPEC Accession Number:
- 4592658
- Digital Object Identifier :
- 10.1109/24.257833
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Sep 1993
- Sponsored by :
- IEEE Reliability Society
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