Referenced Items are not available for this document.
FEHSIM, a switch-level fault simulator, is introduced. It is able to handle stuck-on and stuck-open CMOS faults as well as local bridging faults through novel concepts of internal fault propagation and network analysis. Transistor widths and lengths are taken into account to give a `hard' detection of stuck-on faults. The switch-level model seems to strike a reasonable balance between a detailed electrical model and a simplified and abstract logical model
Date of Conference: 13-16 May 1991
- Page(s):
- 233 - 237
- Meeting Date :
- 13 May 1991-16 May 1991
- Print ISBN:
- 0-8186-2141-9
- INSPEC Accession Number:
- 4183211
- Conference Location :
- Bologna
- Digital Object Identifier :
- 10.1109/CMPEUR.1991.257388
- Product Type:
- Conference Publications
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