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Switch-level fault simulation for non-trivial faults based on abstract data types

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2 Author(s)

FEHSIM, a switch-level fault simulator, is introduced. It is able to handle stuck-on and stuck-open CMOS faults as well as local bridging faults through novel concepts of internal fault propagation and network analysis. Transistor widths and lengths are taken into account to give a `hard' detection of stuck-on faults. The switch-level model seems to strike a reasonable balance between a detailed electrical model and a simplified and abstract logical model

Published in:

CompEuro '91. Advanced Computer Technology, Reliable Systems and Applications. 5th Annual European Computer Conference. Proceedings.

Date of Conference:

13-16 May 1991