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A high-level approach to test generation

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4 Author(s)
P. Narain ; IBM Corp., Endicott, NY, USA ; D. G. Saab ; R. P. Kunda ; J. A. Abraham

A high-level test generation algorithm based upon the branch and bound search procedure is presented. The algorithm is described in detail, highlighting the various tradeoffs that are involved. A complete dependency-directed backtracking scheme that has significant advantage over chronological backtracking is introduced. Different uses for the algorithm are presented to show its versatility. Results showing significant performance improvement over gate level test generation are also presented. The ability to generate tests for incomplete designs is a major strength of this scheme

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IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications  (Volume:40 ,  Issue: 7 )