IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Signal Processing, IEEE Trans ...> Volume:41 Issue:11 Help

Two-dimensional Prony modeling and parameter estimation

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sacchini, J.J. ; Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA ; Steedly, W.M. ; Moses, R.L.

A new method for estimating the two-dimensional (2D) exponential modes and amplitude coefficients in a Prony model is presented. This method involves two parts, each utilizing a 1D singular value decomposition-based technique, and is capable of locating frequencies anywhere in the 2D frequency plane. Simulations are shown which demonstrate the performance of the algorithm

Published in:
Signal Processing, IEEE Transactions on  (Volume:41 ,  Issue: 11 )

Date of Publication: Nov 1993

Page(s):
3127 - 3137
ISSN :
1053-587X
INSPEC Accession Number:
4583009
Digital Object Identifier :
10.1109/78.257242
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
Nov 1993
Sponsored by :
IEEE Signal Processing Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.