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Multi-chip modules for military and adverse environment applications

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1 Author(s)
Port, R.M. ; Hughes Aircraft Co., Los Angeles, CA, USA

Some of the design, inspection, and test trade-offs involved in creating modern high-performance multichip modules (MCMs) for both military and high-end commercial applications with an adverse environment are covered. Design features and qualification tests are discussed. Some more cost-effective MCM testing possibilities are examined.<>

Published in:

Aerospace and Electronic Systems Magazine, IEEE  (Volume:8 ,  Issue: 9 )