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Ellipsoidal method for design centering and yield estimation

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2 Author(s)
Wojciechowski, J.M. ; Warsaw Univ. of Poland, Poland ; Vlach, Jiri

A method for constraint region approximation, design centering and yield estimation is introduced. Extreme points of the constraint region are identified by inscribing into it the largest possible ellipsoid. Ellipsoid center is the point that centers the design. Ellipsoidal, polytope and second order Taylor series approximation schemes to the constraint region are discussed. Accuracy and implementation of the method are outlined. Two examples testing the method are included and applications to centering, tolerancing and yield estimation are shown

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:12 ,  Issue: 10 )