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Testing ADC's at sample rates from 20 to 120 MSPS

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5 Author(s)
Crawley, H.B. ; Dept.of Phys., Iowa State Univ., Ames, IA, USA ; McKay, R. ; Meyer, W.T. ; Rosenberg, E.I.
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Results are presented from an ongoing program to test the performance of high-speed analog-to-digital converters suitable for use at the Superconducting Super Collider (SSC) and Large Hadron Collider (LHC). For each device a large number of parameters is measured, such as number of effective bits, noise level, aperture jitter, nonlinearity, analog bandwidth, and total harmonic distortion. Results from a variety of 8-b and 10-b devices are presented

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Nuclear Science, IEEE Transactions on  (Volume:40 ,  Issue: 4 )