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A general technique for designing totally self-checking checker for 1-out-of-N code with minimum gate delay

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3 Author(s)
D. L. Tao ; Syracuse Univ., NY, USA ; C. R. P. Hartmann ; P. K. Lala

An efficient technique for designing a totally self-checking checker for 1/n code (n>3) with minimum possible gate delay is proposed. The checker consists of a 1/n to k /2k translator and a k/2k code checker. The translator is implemented using a NOR array and checker using a NOR-NOR PLA. The design technique is applicable for all but a few values of n. It has been shown that the checkers constructed using the proposed technique occupy minimum or near-minimum chip area depending on the value of n. This new technique also has the advantage over existing ones in terms of speed or hardware

Published in:

IEEE Transactions on Computers  (Volume:41 ,  Issue: 7 )