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On the testability of one-dimensional ILAs for multiple sequential faults

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1 Author(s)
Vergis, A. ; Dept. of Comput. Sci., Patras Univ., Greece

It is shown that one-dimensional, unilateral iterative logic arrays (ILAs) of combinational cells are C-testable for multiple sequential faults, provided the fault-free cell functions satisfy appropriate conditions. The test sequence is of length O((m 2n2+mn3K), where n (resp. m) is the number of signal values that can be applied to the horizontal (resp. vertical) cell input and Kn-1. Linear testability is also considered. The ripple-carry adder circuit (n=2, m=4) is shown to be C-testable with 699 test vectors

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Computers, IEEE Transactions on  (Volume:41 ,  Issue: 7 )